Jandel
Jandel Engineering Limited
Accuracy and Precision in four-point-probe measurement
Jandel manufacture resistivity probes for all four-point resistivity measurement machines known. They also produce resistivity measurement equipment for the semiconductor industry as well as for universities, laboratory work, and research applications.
Jandel Engineering is a private Ltd Company, established in 1967.
Scientific laboratory equipment for Sheet resistance / Resistivity measurement of semiconductors and thin films using four-point probes.
Do You Have Questions?
Feel free to send us an email:
sage@euris-semiconductor.com
+33 476 35 0707
Stéphane Sage
Four Point Probes Heads
Cylindrical four-point probe
Cylindrical Four Point probe
Opaque thin films can be characterized via their electrical performances. JANDEL is providing “four-point probe heads” as a sensor for measuring the resistivity of the layer (metal layers like sheet resistance, bulk resistivity, ingot resistivity, and more).
JANDEL probes are used with various OEM systems (NAPSON, 280i, RS55, Prometric, CDE Resmap, AIT, …).
Jandel 4pp probe is used in various high-temperature environments like the MACOR probe; a high vacuum cylindrical probe head is also available.
JANDEL manual systems for laboratory resistivity R&D with a fully universal probe station as well as simple micropositioning system and multiposition wafer probe solutions.
Download data sheet:
High/Low Temperature Four Point probe
High/Low Temperature Four Point probe
Jandel Engineering Limited manufactures the Macor probe for use at high or low temperatures. The range the probe can be used in an oven is approximately 80K to 600K. If the sample only is heated the probe can be used for measurements up to 1000K although prolonged contact with the sample should be avoided..
Download data sheet:
RM3000
Test Units for Four-Point Probe Measurements
Associated with RM3000 test unit, tester, or HM21 portable, JANDEL offers a variety of solutions for your surface resistivity 4pp head metrology interests.
Download data sheet:
Multiheight microposition sample stand
Manual Probe Stands
Jandel manufactures a broad range of manual test equipment, the ideal one for each customer depending on the size and shape of samples to be measured, and the space and budget available.
Download data sheet:
- General Purpose Sample Stand (PDF)
- Multiheight Probe Stand (PDF)
- Multiheight microposition sample stand (PDF)
- Multi-position sample stand (PDF)
- Hand Applied Probe (PDF)
- Universal Probe (PDF)
Do You Have Questions?
Feel free to send us an email:
sage@euris-semiconductor.com
+33 476 35 0707
Stéphane Sage
Complete tabletop system
4 point probe system / resistivity measurement
General Purpose System
Jandel Engineering’s popular RM3000+ (link to RM3000+ page) system with Multiheight Probe stand (link to Multiheight Probe stand page) enables precise resistivity measurements on a wide range of sample sizes and shapes, from thin layers to 250 mm-high ingots.
Only vertical movement possible
4 PP / conductivity measurement / electrical characterization
Multipurpose System
The Multipurpose Four Point Probe System combines the RM3000+ Unit, Multiheight Probe Stand, and an X-Y microposition table to enable precise resistivity measurements on diverse samples. From glass slides to 250 mm ingots with micrometer accuracy.
Micrometric X-Y movement possible
4 PP / full integrated measurement solutions/ wafer probing
Wafer probing system
Jandel Engineering’s RM3000+ with Multiposition Probe Stand provides an efficient solution for measuring wafers up to 200 mm in diameter, with two probe sizes available at no additional cost.
Wafer measurement possible
Do You Have Questions?
Feel free to send us an email:
sage@euris-semiconductor.com
+33 476 35 0707
Stéphane Sage
Do You Have Questions?
Feel free to give us a call:
+49 89 35 09 578 -0
Klaus Gailus
Manual Probe Stands
Multiheight Probe Stand
Max. sample size: Samples up to 250mm diameter (300mm diameter option at no extra cost)
Max. sample thickness: Samples up to 250mm high can be measured (higher on request)
Microswitch: Prevents current flow when probe is not in contact with the sample
Manual control: Simple lever operation for probe contact and removal
Simple set up: Single wire connects the probe stand and measurement electronics
Mounting holes: Optional sample tables are available
Microposition Probe Stand
Max. sample size: Samples up to 76mm diameter
Max. sample thickness: Samples up to 4mm thick can be measured
Microswitch: Prevents current flow when probe is not in contact with the sample
Manual control: Simple lever operation for probe contact and removal
Simple set up: Single wire connects the probe stand and measurement electronics
Micrometer slides: 25mm x 25mm with 0.01 increments
Multiheight/Microposition Probe Stand
Max. sample size: Samples up to 250mm diameter (300mm diameter option at no extra cost)
Max. sample thickness: Samples up to 250mm high can be measured (higher on request)
Microswitch: Prevents current flow when probe is not in contact with the sample
Manual control: Simple lever operation for probe contact and removal
Simple set up: Single wire connects the probe stand and measurement electronics
X-Y Stage: Offers micrometer controlled manipulation of small samples