Napson Corporation

Sheet resistance, Resistivity, Four-point probe measurement
Eddy current, Non-contact resistance measurement

Measurement with contact or non-contact for sheet resistance

Measurement of thin-films of semiconductor or glass and film. Silicon resistivity measurement.

Mitarbeiter Portrait

Do You Have Questions?

Feel free to give us a call:
+49 89 35 09 578 -0

Joos Hanssen


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